🎓 Path to a free self-taught education in Computer Science!
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Updated
Jun 20, 2022
🎓 Path to a free self-taught education in Computer Science!
Scan insertion and design of a LBIST wrapper for a RISC-V core for stuck-at fault model
A scientific framework for researching automatic test pattern generation (ATPG)
Path-Oriented Decision Making (PODEM) algorithm for Automatic Test Pattern Generation (ATPG).
Simple EDA tool for fault reduction and testing for combinational circuits
Scientific tool to insert Reconfigurable Scan Networks (RSN) into synthesized circuits to make them testable
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